Improving the Neural Segmentation of Blurry Serial SEM Images by Blind Deblurring.

Ao Cheng^1,2, Kai Kang³, Zhanpeng Zhu⁴, Ruobing Zhang^2,5, Lirong Wang¹

¹School of Electronic and Information Engineering, Soochow University, Suzhou 215009, China.

²Jiangsu Key Laboratory of Medical Optics, Suzhou Institute of Biomedical Engineering and Technology, Chinese Academy of Sciences, Suzhou 215163, China.

³Etiometry, Inc, 280 Summer St Fl 4, Boston, MA 02210, USA.

⁴Department of Neurosurgery, The First Hospital of Jilin University, Changchun, Jilin 130021, China.

⁵Institute of Artificial Intelligence, Hefei Comprehensive National Science Center, Hefei 230088, China.

PubMed PMC DOI PDF

Abstract

Serial scanning electron microscopy (sSEM) has recently been developed to reconstruct complex largescale neural connectomes, through learning-based instance segmentation. However, blurry images are inevitable amid prolonged automated data acquisition due to imprecision in autofocusing and autostigmation, which impose a great challenge to accurate segmentation of the massive sSEM image data. Recent…

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